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APPLICATIONS

D

GND

R

CANH

CANL

SN65HVD230D

(Marked as VP230)

SN65HVD231D (Marked as VP231)

(TOP VIEW)

1

2

3

4

8

7

6

5

NC – No internal connection

D

GND

R

NC

CANH

CANL

NC

SN65HVD232D (Marked as VP232)

(TOP VIEW)

1

2

3

4

8

7

6

5

LOGIC DIAGRAM (POSITIVE LOGIC)

CANL

CANH

R

D

1

4

7

6

SN65HVD230, SN65HVD231

Logic Diagram (Positive Logic)

8

5

3

CANL

CANH

R

D

1

4

7

6

SN65HVD232

Logic Diagram (Positive Logic)

SN65HVD230

SN65HVD231

SN65HVD232

SLOS346H – MARCH 2001 – REVISED JULY 2006

3.3-V CAN TRANSCEIVERS

•

Motor Control

•

Operates With a 3.3-V Supply

•

Industrial Automation

•

Low Power Replacement for the PCA82C250

•

Basestation Control and Status

Footprint

•

Robotics

•

Bus/Pin ESD Protection Exceeds 16 kV HBM

•

Automotive

•

High Input Impedance Allows for 120 Nodes

•

UPS Control

on a Bus

•

Controlled Driver Output Transition Times for

Improved Signal Quality on the SN65HVD230

and SN65HVD231

•

Unpowered Node Does Not Disturb the Bus

•

Compatible With the Requirements of the ISO

11898 Standard

•

Low-Current SN65HVD230 Standby Mode

370

µA Typical

•

Low-Current SN65HVD231 Sleep Mode 40 nA

Typical

•

Megabit/Second (Mbps)

•

Thermal Shutdown Protection

•

Open-Circuit Fail-Safe Design

•

Glitch-Free Power-Up and Power-Down

Protection for Hot-Plugging Applications

(1)

The signaling rate of a line is the number of voltage

transitions that are made per second expressed in the units

bps (bits per second).

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

TMS320Lx240x is a trademark of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Copyright © 2001–2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.