STM32F103RG datasheet(103/120 Pages) STMICROELECTRONICS

103 / 120 page

STM32F103xF, STM32F103xG

Electrical characteristics

Doc ID 16554 Rev 3

103/120

Figure 55.

ADC accuracy characteristics

Table 65.

ADC accuracy(1) (2)(3)

ADC DC accuracy values are measured after internal calibration.

Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.

ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-

robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion

being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to

standard analog pins which may potentially inject negative current.

Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.14 does not

affect the ADC accuracy.

Symbol

Parameter

Test conditions

Typ

Max(4)

Preliminary values.

Unit

Total unadjusted error

fPCLK2 = 56 MHz,

fADC = 14 MHz, RAIN < 10 kΩ,

VDDA = 2.4 V to 3.6 V

Measurements made after

ADC calibration

±2

±5

LSB

Offset error

±1.5

±2.5

Gain error

±1.5

±3

Differential linearity error

±1

±2

Integral linearity error

±1.5

±3

1LSBIDEAL

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

ET=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset Error: deviation between the first actual

transition and the first ideal one.

EG=Gain Error: deviation between the last ideal

transition and the last actual one.

ED=Differential Linearity Error: maximum deviation

between actual steps and the ideal one.

EL=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

4095

4094

4093

456

4093 4094 4095 4096

(1)

(2)

(3)

VDDA

VSSA

ai14395b

VREF+

4096

(or

depending on package)]

VDDA

4096

[1LSBIDEAL =

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