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STM32F413XG Datasheet(PDF) 141 Page - STMicroelectronics

No. de pieza STM32F413XG
Descripción Electrónicos  ARM-Cortex-M4 32b MCUFPU, 125 DMIPS, up to 1.5MB Flash, 320KB RAM, USB OTG FS, 1 ADC, 2 DACs, 2 DFSDMs
PDF  207 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
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STM32F413XG Datasheet(HTML) 141 Page - STMicroelectronics

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STM32F413xG/H
Electrical characteristics
174
QSPI interface characteristics
Unless otherwise specified, the parameters given in the following tables for QSPI are
derived from tests performed under the ambient temperature, fAHB frequency and VDD
supply voltage conditions summarized in Table 16, with the following configuration:
Output speed is set to OSPEEDRy[1:0] = 11
Capacitive load C=20pF
Measurement points are done at CMOS levels: 0.5VDD
Refer to Section 6.3.16: I/O port characteristics for more details on the input/output alternate
function characteristics.
Table 69. QSPI dynamic characteristics in SDR mode(1)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fSCK
1/tc(SCK)
QSPI clock frequency
2.7 V < VDD < 3.6 V
Cload = 20 pF
--
100
MHz
1.71 V < VDD < 3.6 V
Cload = 15 pF
--
80
tw(CKH)
QSPI clock high and low
-
t(CK) / 2 - 1
-
t(CK) / 2
ns
tw(CKL)
t(CK) / 2
-
t(CK) / 2 + 1
ts(IN)
Data input setup time
-
1.5
-
-
th(IN)
Data input hold time
-
3
-
-
tv(OUT)
Data output valid time
2.7 V < VDD < 3.6 V
-
0.5
3
1.71 V < VDD < 3.6 V
-
0.5
1
th(OUT)
Data output hold time
-
0
-
0
1. Guaranteed by characterization results.
Table 70. QSPI dynamic characteristics in DDR mode(1)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fSCK
1/tc(SCK)
QSPI clock frequency
2.7 V < VDD < 3.6 V
Cload = 20 pF
--
80
MHz
1.71 V< VDD < 3.6 V
Cload = 15 pF
--
70



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