6

PRE

POST

HYST

NOM

| V

V

|

V

10

ppm

V

§

·

u

¨

¸

©

¹

Hours

0

100

200

300

400

500

600

700

800

900 1000

-40

-35

-30

-25

-20

-15

-10

-5

0

5

10

D022

12

REF3425-Q1, REF3430-Q1, REF3433-Q1, REF3440-Q1, REF3450-Q1

SBAS901 – JULY 2018

www.ti.com

Product Folder Links: REF3425-Q1 REF3430-Q1 REF3433-Q1 REF3440-Q1 REF3450-Q1

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Copyright © 2018, Texas Instruments Incorporated

8.2 Long-Term Stability

One of the key parameters of the REF34xx-Q1 references is long-term stability. Typical characteristic expressed

as: curves shows the typical drift value for the REF34xx-Q1 is 25 ppm from 0 to 1000 hours. This parameter is

characterized by measuring 32 units at regular intervals for a period of 1000 hours. It is important to understand

that long-term stability is not ensured by design and that the output from the device may shift beyond the typical

25 ppm specification at any time. For systems that require highly stable output voltages over long periods of

time, the designer should consider burning in the devices prior to use to minimize the amount of output drift

exhibited by the reference over time

8.3 Thermal Hysteresis

Thermal hysteresis is measured with the REF34xx-Q1 soldered to a PCB, similar to a real-world application.

Thermal hysteresis for the device is defined as the change in output voltage after operating the device at 25°C,

cycling the device through the specified temperature range, and returning to 25°C. Hysteresis can be expressed

by Equation 1:

where

•

•

•

•

range of –40°C to +125°C and returns to 25°C.

(1)