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IX6611TR Datasheet(PDF) 7 Page - IXYS Corporation

No. de pieza IX6611TR
Descripción Electrónicos  IGBT Gate Driver
PDF  15 Pages
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Fabricante Electrónico  IXYS [IXYS Corporation]
Página de inicio  http://www.ixys.com
Logo IXYS - IXYS Corporation

IX6611TR Datasheet(HTML) 7 Page - IXYS Corporation

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IX6611
R00A
PRELIMINARY
7
1.5.9
Leading Edge Blanking Circuit (LEB)
VCC=PVCC=15V, VEE=PVEE= -5V.
Note: All timing measurements are from 90% input stimulus change to the 10% output response change.
1.5.10
Over Current Comparator
VCC=PVCC=15V, VEE=PVEE= -5V.
Note: Timing measurements are from 90% input stimulus change to the 10% output response change.
1.5.11
Active Clamp Comparator
VCC=PVCC=15V, VEE=PVEE= -5V.
Note: Timing measurements are from 90% input stimulus change to the 10% output response change.
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Blanking source current
IBLNK_SRC
Measured at CBLANK terminal during the
blanking period
180225300
A
Blanking sink current (DC test)
IBLNK_SNK_DC
Force CBLANK to VDD during the IGBT driver
off state
11
18
25
mA
Blanking time (see note)
tBLNK_OPEN
IGBT driver turn-on to turn-off delay time is
measured with ICM terminal set at 500mV and
CBLANK terminal open
V
BLANK=3V
200
400
600
ns
Blanking time (see note)
tBLNK_220pF
IGBT driver turn-on to turn-off delay time is
measured with ICM terminal set at 500mV and
CBLANK=220pF
23.5
5
s
Parameter
Symbol
Conditions
Min
Typ
Max
Units
Over current comparator threshold with respect to
COM
VOCTH
VOCTH is measured during the ON time of the
driver at ICM terminal by monitoring the state
change at the IGBT driver output
240
300
360
mV
Over current comparator response time
(see note)
tOCR
Step input at the ICM terminal with ±50mV
overdrive (delay time is measured from ICM
input to gate drive output)
-150
250
ns
Over current comparator input series resistor
RICM
Measured at ICM terminal during blanking
time
123
k
Over current comparator input shorting switch
on-resistance
RON_ICM
Specification guaranteed by design
-
75
-
Parameter
Symbol
Conditions
Min
Typ
Max
Units
ACL comparator threshold with respect to VEE
VACLTH
VACLTH is measured during the OFF time of
the driver at ACL terminal by monitoring the
state change at the IGBT driver output,
IGBT driver output is connected to 50
 to
COM terminal
2.6
3.1
3.6
V
ACL comparator response time (see note)
TACLR
Step input with ± 500mV overdrive at the ACL
terminal (Information parameter)
-150
-
ns
ACL comparator to driver output tri-state delay time
(see note)
TACL_TRI
Step input at the ACL terminal with ± 500mV
overdrive (delay time is measured from ACL
input to IGBT driver output, IGBT driver output
is connected to 50
 to COM terminal)
-300
-
ns



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