MDU28C

Doc #97040

DATA DELAY DEVICES, INC.

4

12/12/97

Tel: 973-773-2299

Fax: 973-773-9672

http://www.datadelay.com

DELAY LINE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

OUTPUT:

Ambient Temperature: 25

Load:

1 FAST-TTL Gate

Supply Voltage (VDD): 5.0V

± 0.1V

5pf

± 10%

Input Pulse:

High = 5.0V

± 0.1V

Threshold:

2.5V (Rising & Falling)

Low = 0.0V

± 0.1V

Source Impedance:

50

Ω Max.

Rise/Fall Time:

5.0 ns Max. (measured

between 0.5V and 4.5V )

Pulse Width:

Period:

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

O1

OUT

TRIG

IN

REF

TRIG

Test Setup

DEVICE UNDER

TEST (DUT)

TIME INTERVAL

COUNTER

PULSE

GENERATOR

COMPUTER

SYSTEM

PRINTER

I1

O2

I2

0.5V

0.5V

Timing Diagram For Testing

2.5V

2.5V

4.5V

4.5V

2.5V

2.5V

INPUT

SIGNAL

OUTPUT

SIGNAL