ADM1266ACPZ-R7 datasheet(27/62 Pages) AD

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Data Sheet

ADM1266

Rev. A | Page 27 of 62

Nondestructive operation above TJ = 85°C is possible. However,

the electrical specifications are not guaranteed and, in this case, the

EEPROM degrades. Operating the EEPROM above TJ = 85°C

may result in a degradation of retention characteristics. The fault

logging function, which is useful in debugging system problems

that may occur at high temperatures, only writes to fault log

EEPROM locations. If occasional writes to these registers occur

above TJ = 85°C, a slight degradation in the data retention

characteristics of the fault log may occur. It is recommended

that the EEPROM not be written using STORE_USER_ALL

or bulk programming when TJ > 85°C. The degradation in

EEPROM retention for temperatures TJ > 85°C can be

approximated by calculating the dimensionless acceleration

factor using the following equation:

273

USE

STRESS







 ×−









 





where:

AF is the acceleration factor.

Ea, the activation energy, = 0.6 eV.

k = 8.617 × 10−5 eV/°K.

TUSE = 85°C, the specified junction temperature.

TSTRESS is the actual junction temperature.

For example, calculate the effect on retention when operating at

a junction temperature of 125°C for 10 hours.

TSTRESS = 125°C

AF = 7.062

The equivalent operating time at 85°C = 70.62 hours.

Therefore, the overall retention of the EEPROM degrades by

60.62 hours as a result of operation at a junction temperature of

125°C for 10 hours. The effect of this overstress is negligible

when compared to the overall EEPROM retention rating of

87,600 hours at a maximum junction temperature of 85°C.

ADM1266ACPZ-R7 Datasheet(PDF) 27 Page - Analog Devices

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