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STM32L071VB Datasheet(PDF) 89 Page - STMicroelectronics |
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STM32L071VB Datasheet(HTML) 89 Page - STMicroelectronics |
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89 / 148 page  DS10690 Rev 7 89/148 STM32L071xx Electrical characteristics 112 To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Electromagnetic Interference (EMI) The electromagnetic field emitted by the device are monitored while a simple application is executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard which specifies the test board and the pin loading. Table 54. EMI characteristics Symbol Parameter Conditions Monitored frequency band Max vs. frequency range at 32 MHz Unit SEMI Peak level VDD = 3.6 V, TA = 25 °C, LQFP100 package compliant with IEC 61967-2 0.1 to 30 MHz -7 dBµV 30 to 130 MHz 14 130 MHz to 1 GHz 9 EMI Level 2 - |
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