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CMP2010A Datasheet(PDF) 5 Page - Bourns Electronic Solutions

No. de pieza CMP2010A
Descripción Electrónicos  CMP-A Series High Power Anti-Surge Chip Resistors
PDF  8 Pages
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Fabricante Electrónico  BOURNS [Bourns Electronic Solutions]
Página de inicio  http://www.bourns.com
Logo BOURNS - Bourns Electronic Solutions

CMP2010A Datasheet(HTML) 5 Page - Bourns Electronic Solutions

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Performance Characteristics
Test Item
Method
Procedure
Test Limits ΔR
Electrical
Characteristics
AEC-Q200 Table 7.1
Measure the resistance value
DC Resistance:
F: ±1 % : J : ±5 %
TCR: Within the specified
High Temperature
Exposure (Storage)
AEC-Q200 Table 7.3
1000 hours @ T = 125 °C unpowered;
Measurement at 24 ±2 hours after test conclusion
J: ∆ R ≤ ±(3 % + 0.1 Ω)
F: ∆ R ≤ ±(1 % + 0.05 Ω)
Temperature Cycling
AEC-Q200 Table 7.4
1000 cycles (-55 °C to +125 °C);
Measurement at 24 ±2 hours after test conclusion
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
No mechanical damage
Moisture Resistance
AEC-Q200 Table 7.6
Test 65 °C / 80-100 % RH / 10 cycles;
Measurement at 24 ±2 hours after test conclusion
(t = 24 hours/cycle)
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
Biased Humidity
AEC-Q200 Table 7.7
1000 hours 85 °C / 85 % RH, 10 % of operating power;
Measurement at 24 ±2 hours after test conclusion
J: ∆ R ≤ ±(3 % + 0.1 Ω)
F: ∆ R ≤ ±(1 % + 0.05 Ω)
Operational Life
AEC-Q200 Table 7.8
Test 1000 hours @ TA = 125 °C at specified rated power;
Measurement at 24 ±2 hours after test conclusion
J: ∆ R ≤ ±(3 % + 0.1 Ω)
F: ∆ R ≤ ±(1 % + 0.05 Ω)
Mechanical Shock
AEC-Q200 Table 7.13
Test peak value: 100 g’s, wave: hail-sine;
Duration: 6 ms, Velocity: 12.3 ft/sec.
Within product specification
tolerance and no visible
damage
Vibration
AEC-Q200 Table 7.14
5 g’s for 20 min., 12 cycles each of 3 orientations;
Test from 10-2000 Hz
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
No mechanical damage
Resistance to Solder
Heat
AEC-Q200 Table 7.15
Solder dipping @ 270 °C ±5 °C for 10 sec. ±1 sec.
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
No mechanical damage
Thermal Shock
AEC-Q200 Table 7.16
-55 to 155 °C / dwell time 15 min /
max transfer time 20 sec / 300 cycles
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
No mechanical damage
ESD
AEC-Q200-002
Test contact min. 1 KV
∆ R ≤ ±(1 % + 0.1 Ω)
Solderability
AEC-Q200 Table 7.18
a) Baking 155 °C 4H, dipping 235 °C 5 sec
b) Steam 8H, dipping 215 °C 5 sec
c) Steam 8H, dipping 260 °C 7 sec
Over 95 % of termination
must be covered with solder
Flammability
AEC-Q200 Table 7.20
UL-94 V-0 or V-1 are acceptable
Refer UL-94
Board Flex
AEC-Q200 Table 7.21
Bending 2 mm (2512, 1206),
3 mm (0805, 0603)
J: ∆ R ≤ ±(1 % + 0.1 Ω)
F: ∆ R ≤ ±(0.5 % + 0.05 Ω)
No mechanical damage
Terminal Strength
AEC-Q200 Table 7.22
Force 1.8 Kg for 60 sec
No mechanical damage
Sulfur-Resistant
ASTM B-809
+50 °C ±2 °C, 1000 hours
∆ R ≤ ±(1 % + 0.1 Ω)
Specifications are subject to change without notice.
Users should verify actual device performance in their specific applications.
The products described herein and this document are subject to specific legal disclaimers as set forth on the last page of this document, and at www.bourns.com/docs/legal/disclaimer.pdf.
CMP-A Series High Power Anti-Surge Chip Resistors



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