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ICS83940DI Datasheet(PDF) 8 Page - Renesas Technology Corp |
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ICS83940DI Datasheet(HTML) 8 Page - Renesas Technology Corp |
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8 / 17 page ![]() 8 ©2020 Renesas Electronics Corporation January 7, 2020 ICS83940DI Datasheet Table 5C. AC Characteristics, VDD = VDDO = 2.5V ± 5%, TA = -40°C to 85°C NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions. NOTE: All parameters measured at 200MHz unless noted otherwise. NOTE 1: Measured from the differential input crossing point to the output VDDO/2. NOTE 2: Measured from VDD/2 to VDDO/2. NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2. NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2. NOTE 5: This parameter is defined in accordance with JEDEC Standard 65. NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2. Symbol Parameter Test Conditions Minimum Typical Maximum Units fMAX Output Frequency 200 MHz tPLH Propagation Delay PCLK, nPCLK; NOTE 1, 5 ƒ 150MHz 1.2 3.8 ns LVCMOS_CLK; NOTE 2, 5 ƒ 150MHz 1.5 3.2 ns Propagation Delay PCLK, nPCLK; NOTE 1, 5 ƒ > 150MHz 1.5 3.7 ns LVCMOS_CLK; NOTE 2, 5 ƒ > 150MHz 2.0 3.6 ns t sk(o) Output Skew; NOTE 3, 5 PCLK, nPCLK Measured on the Rising Edge at VDDO/2 200 ps LVCMOS_CLK 200 ps t sk(pp) Part-to-Part Skew; NOTE 6 PCLK, nPCLK ƒ 150MHz 2.6 ns LVCMOS_CLK ƒ 150MHz 1.7 ns Part-to-Part Skew; NOTE 6 PCLK, nPCLK ƒ > 150MHz 2.2 ns LVCMOS_CLK ƒ > 150MHz 1.7 ns Part-to-Part Skew; NOTE 4, 5 PCLK, nPCLK Measured on the Rising Edge at VDDO/2 1.2 ns LVCMOS_CLK 1.0 ns tR / tF Output Rise/Fall Time 0.5V to 1.8V 0.3 1.2 ns odc Output Duty Cycle ƒ < 166MHz 40 60 % |
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