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SC1457 Datasheet(PDF) 2 Page - Semtech Corporation |
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SC1457 Datasheet(HTML) 2 Page - Semtech Corporation |
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2 / 13 page ![]() 2 2004 Semtech Corp. www.semtech.com SC1457 POWER MANAGEMENT r e t e m a r a Pl o b m y Sm u m i x a Ms t i n U e g a tl o V y l p p u S t u p n IV N I 7 + o t 6 . 0 -V s e g a tl o V n i P O /IV N E V , G L F V o t 6 . 0 - N I V t n e i b m A o t n o it c n u J e c n a t s i s e R l a m r e h T θ A J 6 5 2W / C ° e s a C o t n o it c n u J e c n a t s i s e R l a m r e h T θ C J 1 8W / C ° e g n a R e r u t a r e p m e T t n e i b m A g n it a r e p OT A 5 8 + o t 0 4 -C ° e g n a R e r u t a r e p m e T n o it c n u J g n it a r e p OT J 5 2 1 + o t 0 4 -C ° e g n a R e r u t a r e p m e T e g a r o t ST G T S 0 5 1 + o t 0 6 -C ° s d n o c e s 0 1 ) g n ir e d l o S ( e r u t a r e p m e T d a e LT D A E L 0 0 3C ° )l e d o M y d o B n a m u H ( g n it a R D S EV D S E 2V k Unless specified: V IN = VOUT + 1V, VEN = VIN, IOUT = 100µA, TA = 25°C. Values in bold apply over full operating ambient temperature range. Absolute Maximum Ratings Electrical Characteristics r e t e m a r a Pl o b m y Ss n o i t i d n o Cn i Mp y Tx a Ms t i n U N I e g n a R e g a tl o V y l p p u SV N I 5 2 . 20 5 . 6 V t n e r r u C y l p p u SI Q I T U O A m 0 5 1 o t A m 0 =5 70 3 1A µ 0 6 1 V N I V , V 5 . 6 = N E V 0 =1 . 00 . 1A µ 5 . 1 T U O e g a tl o V t u p t u O ) 1 ( V T U O I T U O A m 1 =% 5 . 1 -V T U O % 5 . 1 +V A m 0 ≤ I T U O ≤ V , A m 0 5 1 T U O V 1 + ≤ V N I ≤ V 5 . 5 % 0 . 2 -% 0 . 2 + n o it a l u g e R e n i L ) 2 ( ) 1 ( G E R ) E N I L ( V ( ) M O N ( T U O ) V 1 . 0 + ≤ V N I ≤ I , V 5 . 5 T U O A m 1 =5 . 20 1V m 2 1 n o it a l u g e R d a o L ) 1 ( G E R ) D A O L ( I T U O A m 0 5 1 o t A m 1 . 0 =3 -0 1 -V m 0 2 - Exceeding the specifications below may result in permanent damage to the device, or device malfunction. Operation outside of the parameters specified in the Electrical Characteristics section is not implied. Exposure to Absolute Maximum rated conditions for extended periods of time may affect device reliability. |
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