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SN74LVC2G08 Datasheet(PDF) 4 Page - Texas Instruments

No. de pieza SN74LVC2G08
Descripción Electrónicos  SN74LVC2G08 Dual 2-Input Positive-AND Gate
PDF  26 Pages
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Fabricante Electrónico  TI2 [Texas Instruments]
Página de inicio  https://www.ti.com
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SN74LVC2G08 Datasheet(HTML) 4 Page - Texas Instruments

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SN74LVC2G08
SCES198N – APRIL 1999 – REVISED DECEMBER 2015
www.ti.com
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
VCC
Supply voltage
–0.5
6.5
V
VI
Input voltage(2)
–0.5
6.5
V
VO
Voltage applied to any output in the high-impedance or power-off state(2)
–0.5
6.5
V
VO
Voltage applied to any output in the high or low state(2)(3)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±50
mA
Continuous current through VCC or GND
±100
mA
Tj
Junction temperature
150
°C
Tstg
Storage temperature
–65
150
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3)
The value of VCC is provided in the Recommended Operating Conditions table.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Electrostatic
V(ESD)
V
discharge
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1000
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
4
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Product Folder Links: SN74LVC2G08



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