ADL5387 datasheet(30/32 Pages) AD

30 / 32 page

ADL5375

Rev. 0 | Page 30 of 32

F-MOD TEST RACK

SINGLE-TO-DIFFERENTIAL

CIRCUIT BOARD

Q IN DCCM

AGND

I IN DCCM

VN1

VP1

I IN AC

Q IN AC

VPOS +5V

0°

90°

AGILENT 34401A

MULTIMETER

0.200 ADC

AGILENT E3631A

POWER SUPPLY

5.000

0.350A

COM

±25V

–

+ –

AGILENT E3631A

POWER SUPPLY

0.500

0.010A

COM

VCM = 0.5V

±25V

–

+ –

ROHDE & SCHWARTZ

FSEA 30 SPECTRUM ANALYZER

100MHz TO 4GHz

+6dBm

TEKTRONIX AFG3252

DUAL FUNCTION

ARBITRARY FUNCTION GENERATOR

1MHz

AMPL 700mV p-p

PHASE 0°

1MHz

AMPL 700mV p-p

PHASE 90°

CH1

CH2

OUT

ROHDE & SCHWARTZ SMT 06

SIGNAL GENERATOR

FREQ 4MHz TO 4GHz

LEVEL 0dBm

IN1

TSEN

GND

VPOSB VPOSA

OUT

OUTPUT

GND

VPOS

+5V

VPOS +5V

–5V

F-MOD

CHAR BD

Figure 75. Setup for Baseband Frequency Sweep and Undesired Sideband Nulling

The setup used to evaluate baseband frequency sweep and

undesired sideband nulling of the ADL5375 is shown in Figure 75.

The interface board has circuitry that converts the single-ended

I input and Q input from the arbitrary function generator to

differential I and Q baseband signals with a dc bias of 500 mV

(ADL5375-05) or 1500mV (ADL5375-15). Undesired sideband

nulling was achieved through an iterative process of adjusting

amplitude and phase on the Q-channel. See the Sideband

Suppression Optimization section for a detailed description

on sideband nulling.

ADL5387 Datasheet(PDF) 30 Page - Analog Devices

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