| Motor de Búsqueda de Datasheet de Componentes Electrónicos |
|
L9963E Datasheet(PDF) 42 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
L9963E Datasheet(HTML) 42 Page - STMicroelectronics |
|
42 / 184 page ![]() Symbol Parameter Test conditions Min. Typ. Max. Unit VCELL_NOISE1 TCYCLEADC = TCYCLEADC_000 0.1 V ≤ VCELL ≤ 5 V -40 °C < TJ < 125 °C 600 μVrms VCELL_NOISE2 TCYCLEADC = TCYCLEADC_001 0.1 V ≤ VCELL ≤ 5 V -40 °C < TJ < 125 °C 400 μVrms VCELL_NOISE3 TCYCLEADC = TCYCLEADC_010 0.1 V ≤ VCELL ≤ 5 V -40 °C < TJ < 125 °C 200 μVrms VCELL_NOISE4 TCYCLEADC = TCYCLEADC_011, TCYCLEADC_100, TCYCLEADC_101, TCYCLEADC_111 0.1 V ≤ VCELL ≤ 5 V -40 °C < TJ < 125 °C 150 μVrms TCYCLEADC_000 Conversion Time to Measure all cells Tested by SCAN 290 µs TCYCLEADC_001 Tested by SCAN 1.16 ms TCYCLEADC_010 Tested by SCAN 2.32 ms TCYCLEADC_011 Tested by SCAN 9.28 ms TCYCLEADC_100 Tested by SCAN 18.56 ms TCYCLEADC_101 Tested by SCAN 37.12 ms TCYCLEADC_110 Tested by SCAN 74.24 ms TCYCLEADC_111 Tested by SCAN 148.48 ms VCELL_OV Cell Over-voltage Fault Threshold threshVcellOV Application info, tested by SCAN 0 5.80992 V VCELL_OV_RES Cell Over-voltage Fault Threshold Resolution Design info 22.784 mV VCELL_UV Cell Under-voltage Fault Threshold threshVcellUV Application info, tested by SCAN 0 5.80992 V VCELL_UV_RES Cell Under-voltage Fault Threshold Resolution Design info 22.784 mV VCELL_BAL_UV_Δ Cell Balance Under-voltage Fault Threshold Vcell_bal_UV_delta_thr Application info, Tested by SCAN 0 5 V VCELL_BAL_UV_RES Cell Balance Under-voltage Fault Threshold Resolution Design info 22.784 mV RLPF_OPEN Equivalent open resistance in series to Cn pin Application info 4 KΩ VCxOPEN Cx open threshold for series resistor Application info. Maximum voltage drop on the series resistor. To prevent excessive leakage from differential filtering capacitor Tested by SCAN 200 mV IOPEN_DIAG_CX Pulldown current used for cell open load detection For C1..14 40 50 60 μA IOPEN_DIAG_C0 For C0 -60 -50 -40 μA VADC_CROSS_FAIL Critical mismatch between ADC results causing cross-check failure Tested by SCAN 20 mV TCxOPEN_SET Settling time for cell open diagnostics Tested by SCAN 0.7 ms L9963E Cell voltage measurement DS13636 - Rev 12 page 42/184 |
|
Enlace URL |
| ¿ALLDATASHEET es útil para Ud.? [ DONATE ] |
Todo acerca de Alldatasheet | Publicidad | Contáctenos | Política de Privacidad | Enlace a la hoja de datos | Intercambio de Enlaces | Lista de Fabricantes All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |