inputs generated internally to allow synchronous or

asynchronous data transfer from master to slave.

Isolation from external noise and the effects of load-

ing is provided by output buffering.

PARALLEL OPERATION – A high P/S input signal

allows data transfer into the register via the parallel

data lines synchronously with the positive transition

of the clock provided the A/S input is low. If the A/S

input is high the transfer is independent of the clock.

The direction of data flow is controlled by the A/B

input. When this signal is high the A data lines are

inputs (and B data lines are outputs) ; a low A/B sig-

nal reverses the direction of data flow. The AE-input

is an additional feature which allows many registers

to feed data to a common bus. The A DATA lines are

enabled only when this signal is high. Data storage

through recirculation of data in each register stage

is accomplished by making the A/B signal high and

the AE signal low.

SERIALOPERATION – A low P/S signal allows ser-

ial data to transfer into the register synchronously

with the positive transition of the clock. The A/S input

is internally disabled when the register is in the serial

mode (asynchronous

serial operation

is not

allowed). The serial data appears as output data on

either the B lines (when A/B is high) or the A lines

(when A/B is low and the AE signal is high). Register

expansion can be accomplished by simply cascad-

ing HCC/HCF4034B packages.

FUNCTIONAL DIAGRAM

ABSOLUTE MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

Supply Voltage : HCC Types

HCF Types

– 0.5 to + 20

– 0.5 to + 18

V

V

Input Voltage

V

DC Input Current (any one input)

± 10

mA

Total Power Dissipation (per package)

Dissipation per Output Transistor

200

100

mW

mW

Operating Temperature : HCC Types

HCF Types

– 55 to + 125

–40 to + 85

°C

°C

Storage Temperature

– 65 to + 150

°C

Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress

rating only and functional operation of the device at these or any other conditions above those indicated in the operational sec-

tions of this specifi cation is not implied. Exposure to absolute maximum rating conditions for external periods may affect device

reliability.

HCC/HCF4034B

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