ADA4430-1

Rev. C | Page 11 of 20

TEST CIRCUITS

2.6kΩ

2.6kΩ

2.6kΩ

1.3kΩ

SAG

GND

VIN

VOUT

DIS

VS

ADA4430-1

1

2

3

4

5

6

118Ω

RL = 150Ω

50Ω

86.6Ω

0.1µF

TEST GENERATOR

VS+

50Ω

50Ω

TEST RECEIVER

0.5V

×1

Figure 25. Test Circuit Used for Frequency Sweeps and Time-Domain Tests

2.6kΩ

2.6kΩ

2.6kΩ

1.3kΩ

SAG

GND

VIN

VOUT

ADA4430-1

1

2

3

4

5

6

75Ω

RL = 150Ω

75Ω

0.1µF

TEST GENERATOR

DIS

VS

VS+

75Ω

150Ω

150Ω

TEST RECEIVER

1.0V

220µF

×1

Figure 26. Test Circuit Used for Differential Gain, Differential Phase, and Noise Tests