M35080

12/18

Table 9. DC Characteristics

Note: 1. The device meets output requirements for both TTL and CMOS standards.

2. Test performed at –40 to 125°C temperature range, Grade 3.

Note: 1. Sampled only, not 100% tested.

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Leakage Current

±2

µA

Output Leakage Current

±2

µA

Supply Current

3mA

2

3mA

Standby Current

10

µA

20

µA

Input Low Voltage

–0.3

V

Input High Voltage

V

1

Output Low Voltage

0.4

V

2

0.4

V

1

Output High Voltage

V

2

V

Symbol

Parameter

Min

Max

Unit

Input Capacitance (D)

8

pF

Input Capacitance (other pins)

6

pF

Input Signal Pulse Width Filtered Out

10

ns

Table 11. AC Measurement Conditions

Note: 1. Output Hi-Z is defined as the point where data is no long-

er driven.

Input Rise and Fall Times

≤ 50ns

Input Pulse Voltages

Input and Output Timing

Reference Voltages

Output Load

Figure 13. AC Testing Input Output

AI00825

0.8VCC

0.2VCC

0.7VCC

0.3VCC