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VN920SP-E

Table 11. Truth Table

CONDITIONS

INPUT

OUTPUT

SENSE

Normal operation

L

H

L

H

0

Nominal

Overtemperature

L

H

L

L

0

Undervoltage

L

H

L

L

0

0

Overvoltage

L

H

L

L

0

0

Short circuit to GND

L

H

H

L

L

L

0

L

H

H

H

0

< Nominal

Negative output voltage clamp

L

L

0

ISO T/R 7637/1

Test Pulse

TEST LEVELS

I

II

III

IV

Delays and

Impedance

1

-25 V

-50 V

-75 V

-100 V

2 ms 10

Ω

2

+25 V

+50 V

+75 V

+100 V

0.2 ms 10

Ω

3a

-25 V

-50 V

-100 V

-150 V

0.1

µs 50 Ω

3b

+25 V

+50 V

+75 V

+100 V

0.1

µs 50 Ω

4

-4 V

-5 V

-6 V

-7 V

100 ms, 0.01

Ω

5

+26.5 V

+46.5 V

+66.5 V

+86.5 V

400 ms, 2

Ω

ISO T/R 7637/1

Test Pulse

TEST LEVELS RESULTS

I

II

III

IV

1

C

CCC

2

C

CCC

3a

C

CCC

3b

C

CCC

4

C

CCC

5

C

EEE

CLASS

CONTENTS

C

All functions of the device are performed as designed after exposure to disturbance.

E

One or more functions of the device is not performed as designed after exposure to disturbance

and cannot be returned to proper operation without replacing the device.