TLV5535

8-BIT, 35 MSPS, LOW-POWER ANALOG-TO-DIGITAL CONVERTER

SLAS221 – JUNE 1999

5

POST OFFICE BOX 655303

voltage references (unless otherwise noted) (continued)

logic outputs

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOH

High-level output voltage

AVDD = DVDD = DRVDD = 3 V at IOH = 50 µA,

Digital output forced high

2.8

V

VOL

Low-level output voltage

AVDD = DVDD = DRVDD = 3.6 V at IOL = 50 µA,

Digital output forced low

0.1

V

CO

Output capacitance

5

pF

IOZH

High-impedance state output current to

high level

AVDD =DVDD =DRVDD =3 6V

10

µA

IOZL

High-impedance state output current to

low level

AVDD = DVDD = DRVDD = 3.6 V

10

µA

dc accuracy

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Integral nonlinearity (INL) best fit

Internal references (see Note 1)

TA = 25°C

–1.5

±0.7

1.5

LSB

Integral nonlinearity (INL), best-fit

Internal references (see Note 1)

TA = –40°C to 85°C

–2.4

±0.7

2.4

LSB

Differential nonlinearity (DNL)

Internal references (see Note 2),

TA = –40°C to 85°C

–1

±0.6

1.3

LSB

Zero error

AVDD = DVDD = 3.3 V, DRVDD = 3 V,

5

%FS

Full-scale error

DD

DD

DD

Internal references (see Note 3)

5

%FS

NOTES:

1. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero

occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond the last code transition. The

deviation is measured from the center of each particular code to the true straight line between these two endpoints.

2. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure

indicates how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under

test [i.e., (last transition level – first transition level)

÷ (2n – 2)]. Using this definition for DNL separates the effects of gain and offset

error. A minimum DNL better than –1 LSB ensures no missing codes.

3. Zero error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches

the ADC output from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the

bottom reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by

the number of ADC output levels (256).

Full-scale error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that switches

the ADC output from code 254 to code 255. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5

LSB from the top reference level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references

divided by the number of ADC output levels (256).

analog input

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

CI

Input capacitance

4

pF