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SPT7852

ELECTRICAL SPECIFICATIONS

TEST

TEST

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Dynamic Performance

Signal-to-Noise Ratio

(without Harmonics)

VI

53

57

dB

VI

52

56

dB

Harmonic Distortion

VI

56

59

dB

VI

52

54

dB

Signal-to-Noise and Distortion

(SINAD)

VI

52

55

dB

VI

49

52

dB

Channel-to-Channel Crosstalk

IV

70

dB

Channel-to-Channel Gain Matching Full Scale

IV

0.04

dB

Spurious Free Dynamic Range

V

66

dB

Differential Phase

V

0.2

Degree

Differential Gain

V

0.3

%

Digital Inputs

Logic "1" Voltage

VI

2.0

V

Logic "0" Voltage

VI

0.8

V

Maximum Input Current Low

VI

–10

+10

µA

Maximum Input Current High

VI

–10

+10

µA

Input Capacitance

V

5

pF

Digital Outputs

Logic "1" Voltage

VI

V

Logic "0" Voltage

VI

0.4

V

15 pF Load

V

10

ns

Output Enable to Data Output Delay

V

10

ns

50 pF Load Over Temp.

V

22

ns

Power Supply Requirements

IV

4.75

5.0

5.25

V

IV

4.75

5.0

5.25

V

IV

2.7

5.0

5.25

V

Total for Both Converter

VI

15

18

mA

Channels

VI

17

20

mA

Power Dissipation

VI

160

190

mW

TEST LEVEL CODES

All electrical characteristics are subject to the follow-

ing conditions:

All parameters having min/max specifications are

guaranteed. The Test Level column indicates the

specific device testing actually performed during

production and Quality Assurance inspection. Any

blank section in the data column indicates that the

specification is not tested at the specified condition.

TEST PROCEDURE

100% production tested at the specified temperature.

the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and char-

acterization data.

Parameter is a typical value for information purposes only.

teed over specified temperature range.

TEST LEVEL

I

II

III

IV

V

VI