WM2617

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.1 October 2000

2

PIN CONFIGURATION

1

2

3

4

NCS

DIN

SCLK

AGND

REFIN

OUTA

VDD

OUTB

5

6

7

8

PIN DESCRIPTION

PIN NO

NAME

TYPE

DESCRIPTION

1

DIN

Digital input

Serial data input.

2

SCLK

Digital input

Serial clock input.

3

NCS

Digital input

Chip select, active low.

4

OUTB

Analogue output

DAC B analogue output.

5

AGND

Supply

Analogue ground.

6

REFIN

Analogue input

Reference voltage input.

7

OUTA

Analogue output

DAC A analogue output.

8

VDD

Supply

Positive power supply.

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Supply voltage, VDD to AGND

7V

Digital input voltage

-0.3V

VDD + 0.3V

Reference input voltage

-0.3V

VDD + 0.3V

WM2617CD

WM2617ID

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

VDD

2.7

5.5

V

High-level digital input voltage

VDD = 5V

2

V

Low-level digital input voltage

VDD = 5V

0.8

V

Reference voltage to REFIN

VDD - 1.5

V

Load resistance

2k

Ω

Load capacitance

100

Serial Clock Rate

20

WM2637CD

0

70

°C

Operating free-air temperature

WM2637ID

-40

85

°C

Note: Reference voltages greater than VDD/2 will cause saturation for large DAC codes.