Production Data

WM2632

WOLFSON MICROELECTRONICS LTD

PD Rev 1.1 April 2001

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Digital supply voltages, AVDD or DVDD to GND

7V

Reference input voltage

-0.3V

AVDD + 0.3V

Digital input voltage range to GND

-0.3V

DVDD + 0.3V

WM2632CDT

WM2632IDT

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Soldering lead temperature, 1.6mm (1/16 inch) from package body for

10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

AVDD,

DVDD

2.7

5.5

V

High-level digital input voltage

2V

Low-level digital input voltage

0.8

V

AVDD = 5V

GND

2.048

AVDD

Reference voltage to REF

AVDD = 3V

GND

1.024

AVDD

V

Output Load Resistance

2k

Ω

Load capacitance

100

pF

WM2632CDT

0

70

°C

Operating free-air temperature

WM2632IDT

-40

85

°C

Note: Reference input voltages greater than AVDD/2 will cause saturation for large DAC codes.