RFHCS362F datasheet(41/54 Pages) MICROCHIP

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DS41189B-page 41

rfHCS362G/362F

9.0

ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings†

Ambient Temperature under bias..............................................................................................................-40°C to +85°C

Storage Temperature ..............................................................................................................................-40°C to +125°C

Total Power Dissipation(1) ....................................................................................................................................700 mW

Absolute Maximum Ratings Encoder

Voltage on VDD with respect to VSS ..............................................................................................................-0.3 to +6.6V

Max. Output Current sunk by any I/O pin................................................................................................................20 mA

Max. Output Current sourced by any I/O pin...........................................................................................................20 mA

Voltage on all other Encoder pins with respect to VSS ................................................................... -0.3 V to (VDD + 0.3V)

Absolute Maximum Ratings Transmitter

Voltage on VDDRF with respect to VSSRF ......................................................................................................-0.3 to +7.0V

Max. Voltage on RFENIN and DATAFSK pins with respect to VSSRF ...............................................-0.3 to (VDDRF +0.3V)

Max. Current into RFENIN and DATAFSK pins.............................................................................................-1.0 to 1.0 mA

Note 1: Power Dissipation is calculated as follows:

PDIS = VDD x {IDD -

∑IOH} + ∑{(VDD-VOH) x IOH} + ∑(VOL x IOL) + VDDRF x {IDDRF - ∑IOHRF} + ∑{(VDDRF-VOHRF) x IOHRF}

†NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above

those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions

for extended periods may affect device reliability.

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