Data Sheet

©2011 CADEKA Microcircuits LLC

www.cadeka.com

12

Layout Considerations

General layout and supply bypassing play major roles in

high frequency performance. CADEKA has evaluation

boards to use as a guide for high frequency layout and as

an aid in device testing and characterization. Follow the

steps below as a basis for high frequency layout:

• Include 6.8µF and 0.1µF ceramic capacitors for power

supply decoupling

• Place the 6.8µF capacitor within 0.75 inches of the power pin

• Place the 0.1µF capacitor within 0.1 inches of the power pin

• Remove the ground plane under and around the part,

especially near the input and output pins to reduce para-

sitic capacitance

• Minimize all trace lengths to reduce series inductances

Refer to the evaluation board layouts below for more in-

formation.

Evaluation Board Information

The following evaluation boards are available to aid in the

testing and layout of these devices:

Products

CEB006

LM358

CEB018

LM324

Evaluation Board Schematics

Evaluation board schematics and layouts are shown in Fig-

ures 7-12. These evaluation boards are built for dual- sup-

ply operation. Follow these steps to use the board in a

single-supply application:

1. Short -Vs to ground.

directly connected to the ground plane.

Figure 7. CEB006 Schematic

Figure 8. CEB006 Top View

Figure 9. CEB006 Bottom View