TLE 4923

Semiconductor Group

5

1998-04-29

Note: Stresses above those listed here may cause permanent damage to the device.

Exposure to absolute maximum rating conditions for extended periods may affect

device reliability.

Note: Unless otherwise noted, all temperatures refer to junction temperature.

In the operating range the functions given in the circuit description are fulfilled.

1)

Reverse current drawn by the device < 10 mA

2)

Can be reduced significantly by further packaging process, e. g. overmolding.

The device is ESD protected up to 2 kV (HL test procedure)

Absolute Maximum Ratings

Parameter

Symbol

Limit Values

Unit

Remarks

min.

max.

Supply voltage

V

S

– 18

1)

24

V

Capacitor voltage

V

C

– 0.3

3

V

Junction temperature

Junction temperature

Junction temperature

Junction temperature

T

j

T

j

T

j

T

j

150

160

170

190

°C

°C

°C

°C

5000 h

2500 h

500 h

4h

Storage temperature

T

S

– 40

150

°C

Thermal resistance

R

th JA

190

K/W

2)

Operating Range

Parameter

Symbol

Limit Values

Unit

Remarks

min.

max.

Supply voltage

V

S

4.5

18

V

Junction temperature

T

j

– 40

190

°C

Pre-induction

B

0

– 500

500

mT

At Hall probe;

independent of

magnet

orientation

Differential induction

– 40

40

mT