TS881 datasheet(5/17 Pages) STMICROELECTRONICS

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TS881

Electrical characteristics

Doc ID 023340 Rev 1

5/17

Fall time (90% to 10%)

CL =30pF, RL =1 MΩ

110

TON

Power-up time

1.0

1.5

All values over the temperature range are guaranteed through correlation and simulation. No production test is performed

at the temperature range limits.

The offset is defined as the average value of positive and negative trip points (input voltage differences requested to

change the output state in each direction).

The hysteresis is a built-in feature of the TS881 device. It is defined as the voltage difference between the trip points.

Maximum values include unavoidable inaccuracies of the industrial tests.

Table 4.

VCC =+2.7V, Tamb =+25 °C, VICM =VCC/2 (unless otherwise specified)

(1)

Symbol

Parameter

Test conditions

Min.

Typ.

Max.

Unit

VIO

Input offset voltage(2)

-40 °C < Tamb < +125 °C

-6

ΔVIO

Input offset voltage drift

-40 °C < Tamb < +125 °C

µV/°C

VHYST Input hysteresis voltage

(3)

-40 °C < Tamb < +125 °C

1.6

2.7

4.2

IIO

Input offset current(4)

-40 °C < Tamb < +125 °C

100

IIB

Input bias current(4)

-40 °C < Tamb < +125 °C

110

100

ICC

Supply current per operator

No load, output low, VID = -0.1 V

-40 °C < Tamb < +85 °C

-40 °C < Tamb < +125 °C

No load, output high, VID = +0.1 V

-40 °C < Tamb < +85 °C

-40 °C < Tamb < +125 °C

310

220

450

500

1150

350

400

1050

ISC

Short-circuit current

Source

Sink

VOH

Output voltage high

Isource =2 mA

-40 °C < Tamb < +85 °C

-40 °C < Tamb < +125 °C

2.48

2.40

2.10

2.51

VOL

Output voltage low

Isink =2mA

-40 °C < Tamb < +85 °C

-40 °C < Tamb < +125 °C

140

210

230

310

CMRR

Common mode rejection ratio

0 < VICM < VCC

-40 °C < Tamb < +125 °C

TPLH

Propagation delay

(low to high)

f= 1 kHz,CL =30 pF, RL =1MΩ

Overdrive = 10 mV

-40 °C < Tamb < +125 °C

Overdrive = 100 mV

-40 °C < Tamb < +125 °C

6.3

2.4

3.0

3.7

µs

Table 3.

VCC =+1.2V, Tamb = +25 °C, VICM =VCC/2 (unless otherwise specified)

(1) (continued)

Symbol

Parameter

Test conditions

Min.

Typ.

Max.

Unit

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