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ADS5520IPAPR Datasheet(PDF) 13 Page - Texas Instruments |
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ADS5520IPAPR Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 38 page ![]() DEFINITION OF SPECIFICATIONS SNR + 10Log10 P S P N SINAD + 10Log10 P S P N ) PD ENOB + SINAD * 1.76 6.02 ADS5520 www.ti.com....................................................................................................................................................... SBAS310F – MAY 2004 – REVISED OCTOBER 2008 Offset Error Analog Bandwidth The offset error is the difference, given in number of The analog input frequency at which the power of the LSBs, between the ADC's actual average idle fundamental is reduced by 3 dB with respect to the channel output code and the ideal average idle low frequency value. channel output code. This quantity is often mapped into mV. Aperture Delay Temperature Drift The delay in time between the falling edge of the input sampling clock and the actual time at which the The temperature drift coefficient (with respect to gain sampling occurs. error and offset error) specifies the change per degree Celsius of the parameter from TMIN to TMAX. It Aperture Uncertainty (Jitter) is calculated by dividing the maximum deviation of The sample-to-sample variation in aperture delay. the parameter across the TMIN to TMAX range by the difference (TMAX – TMIN). Clock Pulse Width/Duty Cycle Signal-to-Noise Ratio (SNR) The duty cycle of a clock signal is the ratio of the time the clock signal remains at a logic high (clock pulse SNR is the ratio of the power of the fundamental (PS) width) to the period of the clock signal. Duty cycle is to the noise floor power (PN), excluding the power at typically expressed as a percentage. A perfect dc and the first eight harmonics. differential sine wave clock results in a 50% duty cycle. Maximum Conversion Rate SNR is either given in units of dBc (dB to carrier) The maximum sampling rate at which certified when the absolute power of the fundamental is used operation is given. All parametric testing is performed as the reference or dBFS (dB to Full-Scale) when the at this sampling rate unless otherwise noted. power of the fundamental is extrapolated to the Minimum Conversion Rate converter's full-scale range. The minimum sampling rate at which the ADC Signal-to-Noise and Distortion (SINAD) functions. SINAD is the ratio of the power of the fundamental Differential Nonlinearity (DNL) (PS) to the power of all the other spectral components including noise (PN) and distortion (PD), but excluding An ideal ADC exhibits code transitions at analog input dc. values spaced exactly 1LSB apart. The DNL is the deviation of any single step from this ideal value, measured in units of LSBs. Integral Nonlinearity (INL) SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used The INL is the deviation of the ADC's transfer as the reference or dBFS (dB to full-scale) when the function from a best fit line determined by a least power of the fundamental is extrapolated to the squares curve fit of that transfer function, measured converter's full-scale range. in units of LSBs. Effective Number of Bits (ENOB) Gain Error The ENOB is a measure of a converter's performance The gain error is the deviation of the ADC's actual as compared to the theoretical limit based on input full-scale range from its ideal value. The gain quantization noise. error is given as a percentage of the ideal input full-scale range. Gain error does not account for variations in the internal reference voltages (see the Electrical Specifications section for limits on the variation of VREFP and VREFM). Copyright © 2004–2008, Texas Instruments Incorporated Submit Documentation Feedback 13 Product Folder Link(s): ADS5520 |
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