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ADS5522IPAP Datasheet(PDF) 3 Page - Texas Instruments |
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ADS5522IPAP Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 32 page ![]() www.ti.com RECOMMENDED OPERATING CONDITIONS ELECTRICAL CHARACTERISTICS ADS5522 SBAS320C – MAY 2004 – REVISED FEBRUARY 2007 MIN TYP MAX UNIT Supplies AVDD Analog supply voltage 3 3.3 3.6 V DRVDD Output driver supply voltage 3 3.3 3.6 V Analog input Differential input range 2.3 VPP VCM Input common-mode voltage (1) 1.45 1.55 1.65 V Digital Output Maximum output load 10 pF Clock Input ADCLK input sample rate (sine wave) 1/tC 2 80 MSPS Clock amplitude, sine wave, differential(2) 1 3 VPP Clock duty cycle(3) 50% Open free-air temperature range –40 85 C (1) Input common-mode should be connected to CM. (2) See Figure 47 for more information. (3) See Figure 46 for more information. Typical values given at T A = 25 C, min and max specified over the full recommended operating temperature range, AVDD = DRV DD = 3.3 V, sampling rate = 80 MSPS, 50% clock duty cycle, 3-VPP differential clock, and –1-dBFS differential input, unless otherwise noted PARAMETER CONDITIONS MIN TYP MAX UNIT Resolution 12 Bits Analog Inputs Differential input range 2.3 VPP Differential input impedance See Figure 37 6.6 k Ω Differential input capacitance See Figure 37 4 pF Analog input common-mode current (per input) 200 µA Analog input bandwidth Source impedance = 50 Ω 750 MHz Voltage overload recovery time 4 Clock cycles Internal Reference Voltages Reference bottom voltage, V(REFM) 1 V Reference top voltage, V(REFP) 2.15 V Reference error –4% 0.6% 4% 1.55 Common-mode voltage output, V(CM) V 0.05 Dynamic DC Characteristics and Accuracy No missing codes Tested Differential nonlinearity error, DNL fIN = 10 MHz –0.5 0.25 0.5 LSB Integral nonlinearity error, INL fIN = 10 MHz –1.5 0.55 1.5 LSB Offset error -11 ±1.5 11 mV Offset temperature coefficient 0.02 %/ C ∆offset error/∆AV DD from AVDD = 3 V DC power-supply rejection ratio, DC PSRR 0.25 mV/V to AVDD = 3.6 V Gain error (1) -2 ±0.3 2 %FS Gain temperature coefficient –0.02 ∆%/ C (1) Gain error is specified by design and characterization; it is not tested in production. 3 Submit Documentation Feedback |
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