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8XC196KB Datasheet(PDF) 11 Page - Intel Corporation

No. de pieza 8XC196KB
Descripción Electrónicos  COMMERCIAL/EXPRESS CHMOS MICROCONTROLLER
PDF  22 Pages
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Fabricante Electrónico  INTEL [Intel Corporation]
Página de inicio  http://www.intel.com
Logo INTEL - Intel Corporation

8XC196KB Datasheet(HTML) 11 Page - Intel Corporation

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8XC196KB8XC196KB16
AC CHARACTERISTICS (Continued)
Test Conditions Capacitive load on all pins e 100 pF Rise and fall times e 10 ns FOSC e 1216 MHz
The 87C196KB will meet these specifications
Symbol
Description
Min
Max
Units
Notes
FXTAL
Frequency on XTAL1 12 MHz
35
120
MHz
(Note 2)
FXTAL
Frequency on XTAL1 16 MHz
35
160
MHz
(Note 2)
TOSC
1FXTAL 12 MHz
833
286
ns
TOSC
1FXTAL 16 MHz
625
286
ns
TXHCH
XTAL1 High to CLKOUT High or Low
a
20
a
110
ns
TCLCL
CLKOUT Cycle Time
2 TOSC
ns
TCHCL
CLKOUT High Period
TOSC b 10
TOSCa10
ns
TCLLH
CLKOUT Falling Edge to ALE Rising
b
10
a
10
ns
TLLCH
ALE Falling Edge to CLKOUT Rising
b
15
a
15
ns
TLHLH
ALE Cycle Time
4 TOSC
ns
(Note 3)
TLHLL
ALE High Period
TOSC b 10
TOSCa10
ns
TAVLL
Address Setup to ALE Falling Edge
TOSC b 20
ns
TLLAX
Address Hold after ALE Falling Edge
TOSC b 40
ns
TLLRL
ALE Falling Edge to RD Falling Edge
TOSC b 35
ns
TRLCL
RD Low to CLKOUT Falling Edge
a
4
a
25
ns
TRLRH
RD Low Period
TOSCb5TOSC a 25
ns
(Note 3)
TRHLH
RD Rising Edge to ALE Rising Edge
TOSC
TOSC a 25
ns
(Note 1)
TRLAZ
RD Low to Address Float
a
5ns
TLLWL
ALE Falling Edge to WR Falling Edge
TOSC b 10
ns
TCLWL
CLKOUT Low to WR Falling Edge
0
a
25
ns
TQVWH
Data Stable to WR Rising Edge
TOSC b 23
ns
(Note 3)
TCHWH
CLKOUT High to WR Rising Edge
b
5
a
15
ns
TWLWH
WR Low Period
TOSC b 15
TOSC a 5
ns
(Note 3)
TWHQX
Data Hold after WR Rising Edge
TOSC b 15
ns
TWHLH
WR Rising Edge to ALE Rising Edge
TOSC b 15
TOSC a 10
ns
(Note 1)
TWHBX
BHE INST HOLD after WR Rising Edge
TOSC b 15
ns
TRHBX
BHE INST HOLD after RD Rising Edge
TOSC b 10
ns
TWHAX
AD8 – 15 hold after WR Rising Edge
TOSC b 30
ns
TRHAX
AD8 – 15 hold after RD Rising Edge
TOSC b 25
ns
NOTES
1 Assuming back-to-back bus cycles
2 Testing performed at 35 MHz however the device is static by design and will typically operate below 1 Hz
3 When using wait states all 2 TOSCa n where n e number of wait states
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