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TUSB501 Datasheet(PDF) 6 Page - Texas Instruments

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No. de pieza TUSB501
Descripción Electrónicos  USB 3.0 Single Channel Redriver with Equalization
PDF  17 Pages
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

TUSB501 Datasheet(HTML) 6 Page - Texas Instruments

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Tdiff_LH
Tdiff_HL
IN
OUT
24"
1"-6"
Up to 3m
(30AWG)
TUSB501
4"
AWG
Jitter
Measurement
A
TUSB501
SLLSEG5A – AUGUST 2013 – REVISED AUGUST 2013
www.ti.com
AC ELECTRICAL CHARACTERISTICS (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Timing
Apply 0 V to VCC, connect
Time from power applied until RX
SuperSpeed USB termination to
tREADY
9
ms
termination
TX±, apply 3.3 V to VCC, and
measure when ZRX-DIFF is enabled.
Jitter
TJTX-EYE
Total jitter (1) (2)
0.213
UI (3)
EQ = Floating, OS = High,
DJTX
Deterministic jitter (2)
DE = High
0.197
UI (3)
See Figure 1.
RJTX
Random jitter (2) (4)
0.016
UI (3)
(1)
Includes RJ at 10
-12.
(2)
Measured at the ends of reference channel in Figure 1 with K28.5 pattern, VID = 1000 mVpp, 5 Gbps, -3.5 dB de-emphasis from source.
(3)
UI = 200 ps.
(4)
Rj calculated as 14.069 times the RMS random jitter for 10
-12 BER.
spacer
PARAMETER MEASUREMENT INFORMATION
Figure 1. Jitter Measurement Setup
spacer
Figure 2. Propagation Delay
6
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Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: TUSB501



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