IFP006V1 demonstration board description

AN2684

14/21

Doc ID 14266 Rev 1

4.5.4

Surge test

A high energy surge test was performed in differential mode. A high surge signal was

injected on the DUT (device under test) through a 42

Ω decoupling resistor. The test

consisted of three positive and three negative discharges with a repetition rate of 1

discharge per minute.

Figure 14 shows the standard timing waveform applied on the DUT.

Figure 14.

Surge standard timing waveform

Table 5 below shows normal performance of the device.

Table 4.

Burst test results

Burst standard test routines

Level

Voltage (kV)

1.

Classification of the test

(Criteria A): normal performance

(Criteria B): temporary degradation or loss of function or performance with automatic return to normal operation

(Criteria C): temporary degradation or loss of function with external intervention to recover normal operation

(Criteria D): degradation or loss of function, need replacement of damaged components to recover normal

operation.

IEC 61000-4-4

Level 1

0.5

A

IEC 61000-4-4

Level 2

1

A

IEC 61000-4-4

Level 3

2

A

IEC 61000-4-4

Level 4

4

A