AT89C51RD2 / AT89C51ED2 QualPack

Rev. 0 – 2003 July

17

4.3.4.4 Wafer probe Data retention measurement

Data retention has been verified after bake for 168 hours at 250°C on 3 wafers of a standard production lot. The

results are summarized in the table below:

Lot

Wafer

% Retention loss

Failure rate

extrapolation at 55°C

Time to failure

1G4448

6

0%

3.91fit

>> 10 years

1G4448

8

0%

4.19fit

>> 10 years

1G4448

12

0%

3..96fit

>> 10 years

Total

0%

1.34fit

>> 10 years

Conclusion:

Data Retention measurements at wafer probe stand out high data retention capability of AT56800 products,

exceeding the technology requirement of ten years.