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CAT6243DCADJ-RKG Datasheet(PDF) 4 Page - ON Semiconductor |
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CAT6243DCADJ-RKG Datasheet(HTML) 4 Page - ON Semiconductor |
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4 / 15 page ![]() CAT6243 www.onsemi.com 4 Table 5. ELECTRICAL CHARACTERISTICS (VIN = (VOUT + 1 V) or VIN_MIN, whichever is higher, CIN = 1 mF, COUT = 2.2 mF, for typical values TA = 25°C, for Bold values TA = −40°C to 85°C; unless otherwise noted.) Symbol Parameter Conditions Min Typ Max Unit INPUT / OUTPUT VOUT Output Voltage Range CAT6243−ADJ CAT6243DC 0.8 0.8 4.5 5.0 V VOUT−ACC Output Voltage Accuracy CAT6243−ADJ CAT6243DC CAT6243DC Initial accuracy, IOUT = 1 mA −2 −2 −3 +2 +2 +3 % VADJ Voltage at ADJ input 0.784 0.8 0.816 V TCOUT Output Voltage Temp. Coefficient CAT6243−ADJ CAT6243DC 25 50 ppm/ °C IOUT Output Current 0.0001 1 A VR−LINE Line Regulation VIN = VOUT + 1.0 V to VIN(max), IOUT = 10 mA −0.2 ±0.05 0.2 %/V VIN = VOUT + 1.0 V to VIN(max), IOUT = 10 mA −0.35 0.35 VR−LOAD Load Regulation IOUT = 100 mA to 1000 mA 1.5 2 % IOUT = 100 mA to 1000 mA 3 VDO VOUT = 1.2 V IOUT = 300 mA TA = 25°C 600 mV VOUT = 2.5 V CAT6243−ADJ CAT6243DC 110 130 VOUT = 3.3 V 85 VOUT = 1.2 V CAT6243−ADJ CAT6243DC IOUT = 1 A TA = 25°C 625 650 VOUT = 2.5 V CAT6243−ADJ CAT6243DC 350 400 VOUT = 3.3 V 275 IADJ ADJ Input Current 100 nA IGND Ground Current IOUT = 0 mA 70 mA IOUT = 0 mA 100 IOUT = 1000 mA 140 200 IOUT = 1000 mA 250 IGND−SD Shutdown Ground Current CAT6243−ADJ CAT6243DC VEN < 0.4 V 2 5 mA ISC Output short circuit current limit VOUT = 0 V 900 mA PSRR AND NOISE PSRR Power Supply Rejection Ratio CAT6243 f = 1 kHz, BYP = 470 pF, IOUT = 10 mA 54 dB f = 20 kHz, BYP = 470 pF, IOUT = 10 mA 42 eN Output Noise Voltage for 1.8 V output BW = 10 Hz to 100 kHz BYP = 470 pF, IOUT = 10 mA 45 mVrms UVLO, ROUT AND ESR VUVLO Under voltage lockout threshold 1.65 1.75 V ROUT−SH ON resistance of Discharge Transistor 150 W ESR COUT equivalent series resistance 5 500 m W 7. Performance guaranteed over the indicated operating temperature range by design and/or characterization tested at TJ = TA = 25_C. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible. |
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