MPXM2202AS datasheet(32/670 Pages) MOTOROLA

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Figure 13. Photograph of the aqueous alkaline solution test system and the data acquisition system

for

in situ monitoring of the MEMS devices.

LIFETIME MODELING

Reliability techniques provide a means to analyze media

test results and equate the performance to a lifetime

[23–24]. The primary reliability techniques involve an

understanding of the failure rate, life distributions, and

acceleration modeling. The failure rate for a product’s

lifetime follows the bathtub curve. This curve, as shown in

Figure 14, has an early life period with a decreasing failure

rate. Manufacturing defects would be an example of

failures during this portion of the curve. The second portion

of the curve, often described as the useful life region has

a constant failure rate. The last section has an increasing

failure rate and is referred to as the wearout region. This

wearout region would include failure mechanisms such as

corrosion or fatigue.

Figure 14. Bathtub curve showing various failure rate regions.

Product Failure Rate

INFANT MORTALITY

OR EARLY LIFE

FAILURE RATE

END OF LIFE

OR WEAR OUT

FAILURE RATE

Time

STEADY STATE

FAILURE RATE

Lifetime distributions provide a theoretical model to

describe device lifetimes. Common lifetime distributions

include the exponential, Weibull, lognormal, and extreme

value. The exponential distribution models a lifetime with a

constant failure rate An example of the exponential

distribution is a glass which has an equal probability of failing

the moment after it is manufactured, or when its ten years old.

The Weibull and lognormal distribution are all right, or

Freescale Semiconductor, Inc.

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MPXM2202AS Datasheet(PDF) 32 Page - Motorola, Inc

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