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AS7261 Datasheet(PDF) 40 Page - OSRAM GmbH

No. de pieza AS7261
Descripción Electrónicos  XYZ Chromatic White Color Sensor NIR with Electronic Shutter and Smart Interface
PDF  48 Pages
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Fabricante Electrónico  OSRAM [OSRAM GmbH]
Página de inicio  http://www.osram.com
Logo OSRAM - OSRAM GmbH

AS7261 Datasheet(HTML) 40 Page - OSRAM GmbH

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ams Datasheet
Page 39
[v1-00] 2016-Dec-30
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AS7261 − Soldering & Storage Information
Manufacturing Process Considerations
The AS7261 package is compatible with standard reflow
no-clean and cleaning processes including aqueous, solvent or
ultrasonic techniques. However, as an open-aperture device,
precautions must be taken to avoid particulate or solvent
con-tamination as a result of any manufacturing processes,
including pick and place, reflow, cleaning, integration assembly
and/or testing. Temporary covering of the ap-erture is allowed.
To avoid degradation of accuracy or performance in the end
prod-uct, care should be taken that any temporary covering and
associated seal-ants/debris are thoroughly removed prior to
any optical testing or final packaging.
Storage Information
Moisture Sensitivity
Optical characteristics of the device can be adversely affected
during the soldering process by the release and vaporization of
moisture that has been previously absorbed into the package.
To ensure the package contains the smallest amount of
absorbed moisture possible, each device is baked prior to being
dry packed for shipping.
Devices are dry packed in a sealed aluminized envelope called
a moisture-barrier bag with silica gel to protect them from am-
bient moisture during shipping, handling, and storage before
use.
Shelf Life
The calculated shelf life of the device in an unopened moisture
barrier bag is 12 months from the date code on the bag when
stored under the following conditions:
• Shelf Life: 12 months
• Ambient Temperature: < 40°C
• Relative Humidity: < 90%
Rebaking of the devices will be required if the devices exceed
the 12 month shelf life or the Humidity Indicator Card shows
that the devices were exposed to conditions beyond the allow-
able moisture region.



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