5.2 Storage Conditions

Applicable for the DMD as a component or non-operating in a system.

MIN

MAX

UNIT

TDMD

DMD temperature

-40

85

°C

TDP-AVG

Average dew point temperature, non-condensing(1)

28

°C

TDP-ELR

Elevated dew point temperature range, non-condensing(2)

28

36

°C

CTELR

Cumulative time in elevated dew point temperature range

24 months

(1)

The average temperature over time (including storage and operating temperatures) that the device is not in the elevated dew point

temperature range.

(2)

Exposure to dew point temperatures in the elevated range during storage and operation should be limited to less than a total

cumulative time of CTELR.

5.3 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic

Discharge

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±1000

V

Charged device model (CDM), per JEDEC specification ANSI/ESDA/JEDEC

JS-002(2)

±250

V

(1)

JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process.

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DLP391TP

DLPS289A – JUNE 2025 – REVISED SEPTEMBER 2025

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