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MPC8308 Datasheet(PDF) 81 Page - Freescale Semiconductor, Inc |
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MPC8308 Datasheet(HTML) 81 Page - Freescale Semiconductor, Inc |
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81 / 88 page ![]() MPC8308 PowerQUICC II Pro Processor Hardware Specification, Rev. 1 Freescale Semiconductor 81 System Design Information the local ambient conditions explicitly as the board temperature provides a more precise description of the local ambient conditions that determine the temperature of the device. At a known board temperature, the junction temperature is estimated using the following equation: TJ = TB + (RθJB × PD) where: TJ = junction temperature (°C) TB = board temperature at the package perimeter (°C) RθJB = junction-to-board thermal resistance (°C/W) per JESD51–8 PD = power dissipation in the package (W) When the heat loss from the package case to the air can be ignored, acceptable predictions of junction temperature can be made. The application board should be similar to the thermal test condition: the component is soldered to a board with internal planes. 22.2.3 Experimental Determination of Junction Temperature To determine the junction temperature of the device in the application after prototypes are available, the thermal characterization parameter ( Ψ JT) can be used to determine the junction temperature with a measurement of the temperature at the top center of the package case using the following equation: TJ = TT + (ΨJT × PD) where: TJ = junction temperature (°C) TT = thermocouple temperature on top of package (°C) Ψ JT = thermal characterization parameter (°C/W) PD = power dissipation in the package (W) The thermal characterization parameter is measured per JESD51-2 specification using a 40 gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and over about 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire. 23 System Design Information This section provides electrical and thermal design recommendations for successful application of the device |
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