Motor de Búsqueda de Datasheet de Componentes Electrónicos
  Mexican  ▼
ALLDATASHEET.COM.MX

X  

STM8T143 Datasheet(PDF) 45 Page - STMicroelectronics

No. de pieza STM8T143
Descripción Electrónicos  Single-channel capacitive sensor for touch and proximity detection
PDF  65 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM8T143 Datasheet(HTML) 45 Page - STMicroelectronics

Back Button STM8T143 Datasheet HTML 41Page - STMicroelectronics STM8T143 Datasheet HTML 42Page - STMicroelectronics STM8T143 Datasheet HTML 43Page - STMicroelectronics STM8T143 Datasheet HTML 44Page - STMicroelectronics STM8T143 Datasheet HTML 45Page - STMicroelectronics STM8T143 Datasheet HTML 46Page - STMicroelectronics STM8T143 Datasheet HTML 47Page - STMicroelectronics STM8T143 Datasheet HTML 48Page - STMicroelectronics STM8T143 Datasheet HTML 49Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 45 / 65 page
background image
DocID18315 Rev 6
45/65
STM8T143
Electrical characteristics
64
9.7
EMC characteristics
Susceptibility and emission tests are performed on a sample basis during product
characterization.
Both the sample and its applicative hardware environment are mounted on a dedicated
specific EMC board defined in the IEC61967-1 standard.
9.7.1
Functional EMS (electromagnetic susceptibility)
While running in the above described environment the product is stressed by two
electromagnetic events until a failure occurs.
ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test complies with the IEC 1000-4-2
standard.
FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS
through a 100 pF capacitor, until a functional disturbance occurs. This test complies
with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed. The test results are given in
Table 21 based on the EMS levels and classes defined in application note AN1709.
9.7.2
Prequalification trials
9.7.3
Electromagnetic interference (EMI)
Emission tests conform to the IEC61967-2 standard for board layout and pin loading. Worse
case EMI measurements are performed during maximum device activity.
Table 21. EMS data
Symbol
Parameter
Conditions
Level/class
VEFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VSS pins
to induce a functional disturbance
VDD= 5 V, TA=+25 °C,
UFDFPN8 package, complies
with IEC 1000-4-4
4A
Table 22. EMI data
Symbol
Parameter
General conditions
Monitored
frequency band
RCOSC =
1 MHz (1)
1. Data based on characterization results, not tested in production.
Unit
SEMI
Peak level
VDD = 5 V, TA = +25 °C,
UFDFPN8 package,
Complies with SAE
J1752/3, No finger on
touch electrode
0.1 MHz to 30 MHz
-4
dBµV
30 MHz to 130 MHz
-3
130 MHz to 1 GHz
-4
SAE EMI level
-
1



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65


Datasheet Descarga

Go To PDF Page


Enlace URL



¿ALLDATASHEET es útil para Ud.?  [ DONATE ] 

Todo acerca de Alldatasheet   |   Publicidad   |   Contáctenos   |   Política de Privacidad   |   Enlace a la hoja de datos    |   Intercambio de Enlaces   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com