SPT5400SCP datasheet(3/8 Pages) FAIRCHILD

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5/15/00

SPT5400

TEST LEVEL CODES

All electrical characteristics are subject

to the following conditions:

All parameters having min/max specifi-

cations are guaranteed. The Test Level

column indicates the specific device

testing actually performed during pro-

duction and Quality Assurance inspec-

tion. Any blank section in the data

column indicates that the specification

is not tested at the specified condition.

TEST LEVEL

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA = +25 °C, and sample tested at the

specified temperatures.

III

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and characteriza-

tion data.

Parameter is a typical value for information purposes only.

100% production tested at TA = +25 °C. Parameter is guaranteed over

specified temperature range.

Figure 1 – Timing Diagram

t10

A0–A2

D0–D12

NOTES:

1. All input rise and fall times

are measured from 10% to

90% of +5 V. tR = tF = 5 ns.

2. If LD is activated while WR is

low, LD must stay low for t3 or

longer after WR goes high.

Table I – Timing Parameters

PARAMETER

SYMBOL

MIN TYP MAX

UNIT

Pulse Width Low

CLR

Pulse Width Low

100

to WR Low

0ns

High to WR High

0ns

Data Valid to WR Setup

Data Valid to WR Hold

0ns

Address Valid to WR Setup

Address Valid to WR Hold

t10

0ns

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