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AMC008DFLKA Datasheet(PDF) 35 Page - Advanced Micro Devices |
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AMC008DFLKA Datasheet(HTML) 35 Page - Advanced Micro Devices |
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35 / 46 page ![]() AmC0XXDFLKA 35 PIN CAPACITANCE Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. SWITCHING AC CHARACTERISTICS Read Only Operation (Note 1) Note: 1. Input Rise and Fall Times (10% to 90%): ≤ 10 ns, Input Pulse levels: VOL and VOH, Timing Measurement Reference Level: Inputs: VIL and VIH Outputs: VIL and VIH Parameter Symbol Parameter Description Test Conditions Max Unit CIN1 All except A1–A9 VIN = 0 V 2 pF COUT Output Capacitance VOUT = 0 V 2 pF CIN2 A1–A9 VIN = 0 V 2 pF CI/O I/O Capacitance D0–D15 VI/O = 0 V 2 pF Card Speed Parameter Symbol Parameter Description -150 ns Unit JEDEC Standard Min Max tAVAV tRC Read Cycle Time 150 ns tELQV tCE Chip Enable Access Time 150 ns tAVQV tACC Address Access Time 150 ns tGLQV tOE Output Enable Access Time 75 ns tELQX tLZ Chip Enable to Output in Low-Z 5 ns tEHQZ tDF Chip Disable to Output in High-Z 75 ns tGLQX tOLZ Output Enable to Output in Low-Z 5 ns tGHQZ tDF Output Disable to Output in High-Z 75 ns tAXQX tOH Output Hold from First of Address, CE, or OE Change 5 ns |
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