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STL50DN6F7 Datasheet(PDF) 4 Page - STMicroelectronics |
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STL50DN6F7 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 15 page ![]() Electrical characteristics STL50DN6F7 4/15 DocID028132 Rev 2 2 Electrical characteristics (TC = 25 °C unless otherwise specified) Table 4: On /off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID= 1 mA 60 V IDSS Zero gate voltage drain current VDS= 60 V,VGS= 0 V 1 µA IGSS Gate-body leakage current VDS = 0 V, VGS = 20 V 100 nA VGS(th) Gate threshold voltage VDS = VGS, ID = 250 μA 2 4 V RDS(on) Static drain-source on-resistance VGS = 10 V, ID = 7.5 A 9 11 mΩ Table 5: Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS = 30V, f = 1 MHz,VGS= 0 V - 1035 - pF Coss Output capacitance - 450 - pF Crss Reverse transfer capacitance - 53 - pF Qg Total gate charge VDD = 30 V, ID = 15 A, VGS = 10 V (see Figure 14: "Test circuit for gate charge behavior") - 17 - nC Qgs Gate-source charge - 5.7 - nC Qgd Gate-drain charge - 5.7 - nC Table 6: Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 30V, ID =7.5 A, RG = 4.7 Ω, VGS = 10 V (see Figure 13: "Test circuit for resistive load switching times" - 14.5 - ns tr Rise time - 15.3 - ns td(off) Turn-off delay time - 19.4 - ns tf Fall time - 8 - ns Table 7: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit VSD(1) Forward on voltage ISD = 15 A, VGS = 0 V - 1.2 V trr Reverse recovery time ISD = 15 A, di/dt = 100 A/µs, VDD = 48 V (see Figure 15: "Test circuit for inductive load switching and diode recovery times") - 26.8 ns Qrr Reverse recovery charge - 14.2 nC IRRM Reverse recovery current - 1.06 A Notes: (1)Pulsed: pulse duration = 300 µs, duty cycle 1.5% |
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