LTM4650 datasheet(8/28 Pages) AD

8 / 28 page

LTM4660

Rev. 0

For more information www.analog.com

PIN FUNCTIONS

VOUT (A1-3, B1-3, C1-3, D1-3, E3, F3, G3, H3): Output

Voltage. Bypass to ground with capacitors appropriate for

the application. See Decoupling Requirements.

VIN (A5, B5, C5, D5, E5): Main Input Supply. Bypass

this pin to GND with at least 2 × 4.7µF X7R- or X7S-type

capacitors with appropriate voltage rating.

C+ (A6, B6, C6, D6, E6, F6, G5-6, H5-6, J6, K6, L6,

M6): Switch Node Connection to One Terminal of Flying

Capacitor. Voltage at this pin swings between VIN/2

and VIN.

C– (A8-11, B8-11, C8-11, D8, E8, F8, G8, H8, J8, K8,

L8, M8): Switch Node Connection to Internal Power

Inductor and One Terminal of Flying Capacitor. Voltage at

this pin swings between ground and VIN/2.

GND (A12, B12, C12, D9-D12, E9-12, F9-12, G9, H9,

J1-2, K1-2, L1-2, M1): Power Ground. Connect all mod-

ule GND pins to the application’s power ground plane.

MID (E1-2, F1-2, G1-2, G10-12, H1, H10-12, J10-12):

Half Supply from VIN. Do not use this to source current.

Connect MLCC bypass capacitors from this node to GND.

A minimum of 8 × 10µF X7R or X7S MLCC capacitors is

recommended. Higher efficiency can be achieved with

12 × 10µF X7R or X7S MLCC capacitors. All MID pins are

internally connected within the module, but in order for

the LTM4660 to achieve the best possible efficiency, it is

necessary to connect all MID pins together with large cop-

per plane(s) external to the module. See the Applications

Information section.

VINSNS (F5): VIN Kelvin Sensing Input. Used to accurately

sense input voltage. Connect to VIN, under the module.

MIDSNS (H2): MID Kelvin Sensing Input. Used to accurately

sense MID voltage. Connect to MID under the module.

FAULT (J3): Open Drain Output pin. When the signal goes

low, it indicates one of the following conditions:

a. In the capacitor balancing phase, capacitors CFLY or

CMID (see Typical Applications) are not charged to

VIN/2. A low FAULT indicates an abnormal condition

that is preventing CFLY or CMID from being be charged

up to VIN/2.

b. During normal operation, the voltage deviates from

VIN/2 by a window amount set by the voltage on the

HYS_PRGM pin.

c. The die temperature exceeds its internally set limit or

the PTC resistor connected as the lower leg of a resistor

divider (if used) trips the TEMP pin threshold.

During any of the aforementioned conditions, the TRACK/

SS pin will also be pulled low.

INTVCC (J4): Internal Regulator Output. Powers control

circuits and gate drivers internal to the module. Leave

this pin floating.

TEMP+ (J9): Temperature Sensor, Positive Input. Emitter

of a 2N3906-genre PNP bipolar junction transistor (BJT).

Optionally interface to temperature monitoring circuitry

such as LTC®2997, LTC2990, LTC2974 or LTC2975.

Otherwise leave electrically open.

TEMP– (K9): Temperature Sensor, Negative Input.

Collector-base of a 2N3906-genre PNP bipolar junction

transistor (BJT). Optionally interface to temperature mon-

itoring circuitry such as LTC2997, LTC2990, LTC2974 or

LTC2975. Otherwise leave electrically open.

TIMER (K3): Charge Balancing Timer Input. A capaci-

tor connected from this pin to SGND sets the amount of

time allocated to charge CFLY and CMID to VIN/2 during

the capacitor balancing phase. It also sets the auto-retry

timeout, should the capacitors fail to reach this voltage

within the set time. Capacitors CFLY and CMID begin and

end charging when the TIMER voltage is between 0.5V

and 1.2V, respectively. If the capacitor is balanced before

the TIMER voltage reaches 1.2V, this voltage is reset to

ground and normal operation begins. However, if the bal-

ance is not reached when the voltage reaches 1.2V, then

the charging of the capacitors stops and the auto-retry

timeout period begins. The TIMER capacitor will now

slew at half the rate until it reaches 4V and then resets

to zero and begins to slew at 1× rate. Once it reaches

0.5V, the CFLY and CMID begin to charge again and the

process repeats.

TEST (K4): Test Pin. Used in ATE test, only. Leave

open circuit.

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