AMP01

–7–

REV. D

AMP01NBC

AMP01GBC

Parameter

Symbol

Conditions

Typical

Typical

Units

Input Offset Voltage Drift

0.15

0.30

µV/°C

Output Offset Voltage Drift

∞

20

50

µV/°C

Input Bias Current Drift

40

50

pA/

°C

Input Offset Current Drift

3

5

pA/

°C

Nonlinearity

G = 1000

0.0007

0.0007

%

Voltage Noise Density

G = 1000

5

5

nV/

√Hz

Current Noise Density

G = 1000

0.15

0.15

pA/

√Hz

Voltage Noise

G = 1000

0.1 Hz to 10 Hz

0.12

0.12

µV p-p

Current Noise

G = 1000

2

2

pA p-p

0.1 Hz to 10 Hz

Small-Signal Bandwidth (–3 dB) BW

G = 1000

26

26

kHz

Slew Rate

SR

G = 10

4.5

4.5

V/

µs

Settling Time

To 0.01%, 20 V Step

G = 1000

50

50

µs

NOTE

Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed

for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.