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STL33N60M6 Datasheet(PDF) 3 Page - STMicroelectronics |
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STL33N60M6 Datasheet(HTML) 3 Page - STMicroelectronics |
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3 / 15 page ![]() 2 Electrical characteristics (Tcase = 25 °C unless otherwise specified). Table 4. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID = 1 mA 600 V IDSS Zero gate voltage drain current VGS = 0 V, VDS = 600 V 1 µA VGS = 0 V, VDS = 600 V, Tcase = 125 °C(1) 100 IGSS Gate-body leakage current VDS = 0 V, VGS = ±25 V ±5 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 250 µA 3.25 4 4.75 V RDS(on) Static drain-source on- resistance VGS = 10 V, ID = 10.5 A 0.115 0.137 Ω 1. Defined by design, not subject to production test. Table 5. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS = 100 V, f = 1 MHz, VGS = 0 V - 1515 - pF Coss Output capacitance - 128 - Crss Reverse transfer capacitance - 4.2 - Coss eq.(1) Equivalent output capacitance VDS = 0 to 480 V, VGS = 0 V - 269 - pF RG Intrinsic gate resistance f = 1 MHz, ID = 0 A - 1.5 - Ω Qg Total gate charge VDD = 480 V, ID = 25 A, VGS = 0 to 10 V (see Figure 14. Test circuit for gate charge behavior) - 33.4 - nC Qgs Gate-source charge - 7.2 - Qgd Gate-drain charge - 16.3 - 1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS. Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 300 V, ID = 12.5 A, RG = 4.7 Ω, VGS = 10 V (see Figure 13. Switching times test circuit for resistive load and Figure 18. Switching time waveform) - 19.5 - ns tr Rise time - 33 - td(off) Turn-off delay time - 38.5 - tf Fall time - 7.5 - STL33N60M6 Electrical characteristics DS12638 - Rev 3 page 3/15 |
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