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CC1021-RTR1 Datasheet(PDF) 81 Page - Texas Instruments

No. de pieza CC1021-RTR1
Descripción Electrónicos  Single Chip Low Power RF Transceiver for Narrowband Systems
PDF  92 Pages
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI - Texas Instruments

CC1021-RTR1 Datasheet(HTML) 81 Page - Texas Instruments

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CC1021
SWRS045
Page 81 of 91
TEST1 Register (21h, for test only)
REGISTER
NAME
Default
value
Active
Description
TEST1[7:4]
CAL_DAC_OPEN[3:0]
4
-
Calibration DAC override value, active when
BREAK_LOOP=1
TEST1[3:0]
CHP_CO[3:0]
13
-
Charge pump current override value
TEST2 Register (22h, for test only)
REGISTER
NAME
Default
value
Active
Description
TEST2[7]
BREAK_LOOP
0
H
0: PLL loop closed
1: PLL loop open
TEST2[6]
CHP_OVERRIDE
0
H
0: use calibrated value
1: use CHP_CO[3:0] value
TEST2[5]
VCO_OVERRIDE
0
H
0: use calibrated value
1: use VCO_AO[4:0] value
TEST2[4:0]
VCO_AO[4:0]
16
-
VCO_ARRAY override value
TEST3 Register (23h, for test only)
REGISTER
NAME
Default
value
Active
Description
TEST3[7]
VCO_CAL_MANUAL
0
H
Enables ìmanualî VCO calibration (test only)
TEST3[6]
VCO_CAL_OVERRIDE
0
H
Override VCO current calibration
0: Use calibrated value
1: Use VCO_CO[5:0] value
VCO_CAL_OVERRIDE controls VCO_CAL_CLK if
VCO_CAL_MANUAL=1. Negative transitions are then
used to sample VCO_CAL_COMP.
TEST3[5:0]
VCO_CO[5:0]
6
-
VCO_CAL_CURRENT override value
TEST4 Register (24h, for test only)
REGISTER
NAME
Default
value
Active
Description
TEST4[7]
CHP_DISABLE
0
H
Disable normal charge pump operation
TEST4[6]
CHP_TEST_UP
0
H
Force charge pump to output ìupî current
TEST4[5]
CHP_TEST_DN
0
H
Force charge pump to output ìdownî current
TEST4[4:3]
TM_IQ[1:0]
0
-
Value of differential I and Q outputs from mixer when
TM_ENABLE=1
0: I output negative, Q output negative
1: I output negative, Q output positive
2: I output positive, Q output negative
3: I output positive, Q output positive
TEST4[2]
TM_ENABLE
0
H
Enable DC control of mixer output (for testing)
TEST4[1]
TF_ENABLE
0
H
Connect analog test module to filter inputs
TEST4[0]
TA_ENABLE
0
H
Connect analog test module to ADC inputs
If TF_ENABLE=1 or TA_ENABLE=1 in TEST4 register, then INTERFACE[3:0] controls analog test
module: INTERFACE[3] = TEST_PD, INTERFACE[2:0] = TEST_MODE[2:0]. Otherwise, TEST_PD=1
and TEST_MODE[2]=1.
TEST5 Register (25h, for test only)
REGISTER
NAME
Default
value
Active
Description
TEST5[7]
F_COMP_ENABLE
0
H
Enable frequency comparator output F_COMP from
phase detector
TEST5[6]
SET_DITHER_CLOCK
1
H
Enable dithering of delta-sigma clock
TEST5[5]
ADC_TEST_OUT
0
H
Outputs ADC samples on LOCK and DIO, while
ADC_CLK is output on DCLK
TEST5[4]
CHOP_DISABLE
0
H
Disable chopping in ADC integrators
TEST5[3]
SHAPING_DISABLE
0
H
Disable ADC feedback mismatch shaping
TEST5[2]
VCM_ROT_DISABLE
0
H
Disable rotation for VCM mismatch shaping
TEST5[1:0]
ADC_ROTATE[1:0]
0
-
Control ADC input rotation
0: Rotate in 00 01 10 11 sequence
1: Rotate in 00 10 11 01 sequence
2: Always use 00 position
3: Rotate in 00 10 00 10 sequence



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