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AD6679 Datasheet(PDF) 33 Page - Analog Devices |
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AD6679 Datasheet(HTML) 33 Page - Analog Devices |
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33 / 81 page ![]() Data Sheet AD6679 Rev. B | Page 33 of 81 Register 0x024 enables the user to use either this internal 1.0 V reference, or to provide an external 1.0 V reference. When using an external voltage reference, provide a 1.0 V reference. The full-scale adjustment is made using the SPI, irrespective of the reference voltage. For more information on adjusting the full- scale level of the AD6679, refer to the Memory Map Register Table section. The use of an external reference may be necessary, in some applications, to enhance the gain accuracy of the ADC or improve thermal drift characteristics. Figure 51 shows the typical drift characteristics of the internal 1.0 V reference. –50 0 25 90 TEMPERATURE (°C) 0.9998 0.9999 1.0000 1.0001 1.0002 1.0003 1.0004 1.0005 1.0006 1.0007 1.0008 1.0009 1.0010 Figure 51. Typical V_1P0 Drift The external reference must be a stable 1.0 V reference. The ADR130 is a good option for providing the 1.0 V reference. Figure 55 shows how the ADR130 can be used to provide the external 1.0 V reference to the AD6679. The gray areas show unused blocks within the AD6679 while the ADR130 provides the external reference. CLOCK INPUT CONSIDERATIONS For optimum performance, drive the AD6679 sample clock inputs (CLK+ and CLK−) with a differential signal. This signal is typically ac-coupled to the CLK+ and CLK− pins via a transformer or clock drivers. These pins are biased internally and require no additional biasing. Figure 52 shows one preferred method for clocking the AD6679. The low jitter clock source is converted from a single- ended signal to a differential signal using an RF transformer. ADC CLK+ CLK– 0.1µF 0.1µF 100Ω 50Ω CLOCK INPUT 1:1Z Figure 52. Transformer Coupled Differential Clock Another option is to ac couple a differential CML or LVDS signal to the sample clock input pins as shown in Figure 53 and Figure 54. ADC CLK+ CLK– 0.1µF 0.1µF Z0 = 50Ω Z0 = 50Ω 33Ω 33Ω 71Ω 10pF 3.3V Figure 53. Differential CML Sample Clock ADC CLK+ CLK– 0.1µF 0.1µF 0.1µF 0.1µF 50Ω1 50Ω1 100Ω CLOCK INPUT LVDS DRIVER CLK+ CLK– 1 50Ω RESISTORS ARE OPTIONAL. CLOCK INPUT Figure 54. Differential LVDS Sample Clock Clock Duty Cycle Considerations Typical high speed ADCs use both clock edges to generate a variety of internal timing signals. As a result, these ADCs may be sensitive to the clock duty cycle. Commonly, a 5% tolerance is required on the clock duty cycle to maintain dynamic performance characteristics. In applications where the clock duty cycle cannot be guaranteed to be 50%, a higher multiple frequency clock can be supplied to the AD6679. For example, the AD6679 can be clocked at 2 GHz with the internal clock divider set to 4. This ensures a 50% duty cycle, high slew rate internal clock for the ADC. See the Memory Map section for more details on using this feature. FULL-SCALE VOLTAGE ADJUST V_1P0 0.1µF VOUT 4 SET 5 NC 6 VIN 3 GND 2 NC 1 ADR130 0.1µF INPUT FULL-SCALE CONTROL INTERNAL V_1P0 GENERATOR Figure 55. External Reference Using the ADR130 |
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