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AD6679 Datasheet(PDF) 33 Page - Analog Devices

No. de pieza AD6679
Descripción Electrónicos  135 MHz BW IF Diversity Receiver
PDF  81 Pages
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Fabricante Electrónico  AD [Analog Devices]
Página de inicio  http://www.analog.com
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AD6679 Datasheet(HTML) 33 Page - Analog Devices

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Data Sheet
AD6679
Rev. B | Page 33 of 81
Register 0x024 enables the user to use either this internal 1.0 V
reference, or to provide an external 1.0 V reference. When using
an external voltage reference, provide a 1.0 V reference. The
full-scale adjustment is made using the SPI, irrespective of the
reference voltage. For more information on adjusting the full-
scale level of the AD6679, refer to the Memory Map Register
Table section.
The use of an external reference may be necessary, in some
applications, to enhance the gain accuracy of the ADC or
improve thermal drift characteristics. Figure 51 shows the
typical drift characteristics of the internal 1.0 V reference.
–50
0
25
90
TEMPERATURE (°C)
0.9998
0.9999
1.0000
1.0001
1.0002
1.0003
1.0004
1.0005
1.0006
1.0007
1.0008
1.0009
1.0010
Figure 51. Typical V_1P0 Drift
The external reference must be a stable 1.0 V reference. The
ADR130 is a good option for providing the 1.0 V reference.
Figure 55 shows how the ADR130 can be used to provide the
external 1.0 V reference to the AD6679. The gray areas show
unused blocks within the AD6679 while the ADR130 provides
the external reference.
CLOCK INPUT CONSIDERATIONS
For optimum performance, drive the AD6679 sample clock
inputs (CLK+ and CLK−) with a differential signal. This signal
is typically ac-coupled to the CLK+ and CLK− pins via a
transformer or clock drivers. These pins are biased internally
and require no additional biasing.
Figure 52 shows one preferred method for clocking the
AD6679. The low jitter clock source is converted from a single-
ended signal to a differential signal using an RF transformer.
ADC
CLK+
CLK–
0.1µF
0.1µF
100Ω
50Ω
CLOCK
INPUT
1:1Z
Figure 52. Transformer Coupled Differential Clock
Another option is to ac couple a differential CML or LVDS
signal to the sample clock input pins as shown in Figure 53 and
Figure 54.
ADC
CLK+
CLK–
0.1µF
0.1µF
Z0 = 50Ω
Z0 = 50Ω
33Ω
33Ω
71Ω
10pF
3.3V
Figure 53. Differential CML Sample Clock
ADC
CLK+
CLK–
0.1µF
0.1µF
0.1µF
0.1µF
50Ω1
50Ω1
100Ω
CLOCK INPUT
LVDS
DRIVER
CLK+
CLK–
1
50Ω RESISTORS ARE OPTIONAL.
CLOCK INPUT
Figure 54. Differential LVDS Sample Clock
Clock Duty Cycle Considerations
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals. As a result, these ADCs may
be sensitive to the clock duty cycle. Commonly, a 5% tolerance
is required on the clock duty cycle to maintain dynamic
performance characteristics. In applications where the clock
duty cycle cannot be guaranteed to be 50%, a higher multiple
frequency clock can be supplied to the AD6679. For example,
the AD6679 can be clocked at 2 GHz with the internal clock
divider set to 4. This ensures a 50% duty cycle, high slew rate
internal clock for the ADC. See the Memory Map section for
more details on using this feature.
FULL-SCALE
VOLTAGE
ADJUST
V_1P0
0.1µF
VOUT 4
SET 5
NC
6
VIN
3
GND
2
NC
1
ADR130
0.1µF
INPUT
FULL-SCALE
CONTROL
INTERNAL
V_1P0
GENERATOR
Figure 55. External Reference Using the ADR130



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