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S25FL256SDPNFAQ Datasheet(PDF) 122 Page - Cypress Semiconductor |
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S25FL256SDPNFAQ Datasheet(HTML) 122 Page - Cypress Semiconductor |
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122 / 149 page ![]() Document Number: 001-98283 Rev. *M Page 121 of 148 S25FL128S/S25FL256S 10. Data Integrity 10.1 Erase Endurance Note: 1. Each write command to a non-volatile register causes a PE cycle on the entire non-volatile register array. 10.2 Data Retention Contact Cypress Sales and FAE for further information on the data integrity. An application note is available at: www.cypress.com/appnotes Table 10.1 Erase Endurance Parameter Minimum Unit Program/Erase cycles per main Flash array sectors 100K PE cycle Program/Erase cycles per PPB array or non-volatile register array (1) 100K PE cycle Table 10.2 Data Retention Parameter Test Conditions Minimum Time Unit Data Retention Time 10K Program/Erase Cycles 20 Years 100K Program/Erase Cycles 2 Years |
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