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CC1021-RTR1 Datasheet(PDF) 75 Page - Texas Instruments

No. de pieza CC1021-RTR1
Descripción Electrónicos  Single Chip Low Power RF Transceiver for Narrowband Systems
PDF  91 Pages
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Fabricante Electrónico  TI1 [Texas Instruments]
Página de inicio  http://www.ti.com
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CC1021-RTR1 Datasheet(HTML) 75 Page - Texas Instruments

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Not Recommended for New Designs NRND
CC1021
www.ti.com
SWRS045D – JANUARY 2006 – REVISED JANUARY 2015
Table 5-52. TEST2 Register (22h, for Test Only)
DEFAULT
REGISTER
NAME
ACTIVE
DESCRIPTION
VALUE
TEST2[7]
BREAK_LOOP
0
H
0: PLL loop closed
1: PLL loop open
TEST2[6]
CHP_OVERRIDE
0
H
0: use calibrated value
1: use CHP_CO[3:0] value
TEST2[5]
VCO_OVERRIDE
0
H
0: use calibrated value
1: use VCO_AO[4:0] value
TEST2[4:0]
VCO_AO[4:0]
16
VCO_ARRAY override value
Table 5-53. TEST3 Register (23h, for Test Only)
DEFAULT
REGISTER
NAME
ACTIVE
DESCRIPTION
VALUE
TEST3[7]
VCO_CAL_MANUAL
0
H
Enables “manual” VCO calibration (test only)
TEST3[6]
VCO_CAL_OVERRIDE
0
H
Override VCO current calibration
0: Use calibrated value
1: Use VCO_CO[5:0] value
VCO_CAL_OVERRIDE controls VCO_CAL_CLK
if VCO_CAL_MANUAL=1. Negative transitions are then used to
sample VCO_CAL_COMP.
TEST3[5:0]
VCO_CO[5:0]
6
VCO_CAL_CURRENT override value
Table 5-54. TEST4 Register (24h, for Test Only)(1)
DEFAULT
REGISTER
NAME
ACTIVE
DESCRIPTION
VALUE
TEST4[7]
CHP_DISABLE
0
H
Disable normal charge pump operation
TEST4[6]
CHP_TEST_UP
0
H
Force charge pump to output “up” current
TEST4[5]
CHP_TEST_DN
0
H
Force charge pump to output “down” current
TEST4[4:3]
TM_IQ[1:0]
0
Value of differential I and Q outputs from mixer when TM_ENABLE=1
0: I output negative, Q output negative
1: I output negative, Q output positive
2: I output positive, Q output negative
3: I output positive, Q output positive
TEST4[2]
TM_ENABLE
0
H
Enable DC control of mixer output (for testing)
TEST4[1]
TF_ENABLE
0
H
Connect analog test module to filter inputs
TEST4[0]
TA_ENABLE
0
H
Connect analog test module to ADC inputs
(1)
If TF_ENABLE=1 or TA_ENABLE=1 in TEST4 register, then INTERFACE[3:0] controls analog test module: INTERFACE[3] = TEST_PD,
INTERFACE[2:0] = TEST_MODE[2:0]. Otherwise, TEST_PD=1 and TEST_MODE[2]=1.
Table 5-55. TEST5 Register (25h, for Test Only)
DEFAULT
REGISTER
NAME
ACTIVE
DESCRIPTION
VALUE
TEST5[7]
F_COMP_ENABLE
0
H
Enable frequency comparator output F_COMP from phase detector
TEST5[6]
SET_DITHER_CLOCK
1
H
Enable dithering of delta-sigma clock
TEST5[5]
ADC_TEST_OUT
0
H
Outputs ADC samples on LOCK and DIO, while ADC_CLK is output
on DCLK
TEST5[4]
CHOP_DISABLE
0
H
Disable chopping in ADC integrators
TEST5[3]
SHAPING_DISABLE
0
H
Disable ADC feedback mismatch shaping
TEST5[2]
VCM_ROT_DISABLE
0
H
Disable rotation for VCM mismatch shaping
Copyright © 2006–2015, Texas Instruments Incorporated
Detailed Description
75
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Product Folder Links: CC1021



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